Masaki Hashizume, Toshimasa Kuchii, Takeomi Tamesada. Supply Current Test for Unit-to-unit Variations of Electrical Characteristics in Gates. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 372-377, IEEE Computer Society, 1997. [doi]
@inproceedings{HashizumeKT97,
title = {Supply Current Test for Unit-to-unit Variations of Electrical Characteristics in Gates},
author = {Masaki Hashizume and Toshimasa Kuchii and Takeomi Tamesada},
year = {1997},
url = {http://csdl.computer.org/comp/proceedings/ats/1997/8209/00/82090372abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/HashizumeKT97},
cites = {0},
citedby = {0},
pages = {372-377},
booktitle = {6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan},
publisher = {IEEE Computer Society},
isbn = {0-8186-8209-4},
}