High speed IDDQ test and its testability for process variation - researchr publication authors

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Masaki Hashizume, Hiroyuki Yotsuyanagi, Masahiro Ichimiya, Takeomi Tamesada, Masashi Takeda. High speed IDDQ test and its testability for process variation. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 344-349, IEEE Computer Society, 2000. [doi]

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