Masaki Hashizume, Hiroyuki Yotsuyanagi, Masahiro Ichimiya, Takeomi Tamesada, Masashi Takeda. High speed IDDQ test and its testability for process variation. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 344-349, IEEE Computer Society, 2000. [doi]
Abstract is missing.