Masaki Hashizume, Hiroyuki Yotsuyanagi, Masahiro Ichimiya, Takeomi Tamesada, Masashi Takeda. High speed IDDQ test and its testability for process variation. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 344-349, IEEE Computer Society, 2000. [doi]
@inproceedings{HashizumeYITT00,
title = {High speed IDDQ test and its testability for process variation},
author = {Masaki Hashizume and Hiroyuki Yotsuyanagi and Masahiro Ichimiya and Takeomi Tamesada and Masashi Takeda},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/ats/2000/0887/00/08870344abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/HashizumeYITT00},
cites = {0},
citedby = {0},
pages = {344-349},
booktitle = {9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan},
publisher = {IEEE Computer Society},
isbn = {0-7695-0887-1},
}