Masaki Hashizume, Daisuke Yoneda, Hiroyuki Yotsuyanagi, Tetsuo Tada, Takeshi Koyama, Ikuro Morita, Takeomi Tamesada. I_DDQ Test Method Based on Wavelet Transformation for Noisy Current Measurement Environment. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 112-117, IEEE Computer Society, 2004. [doi]
Abstract is missing.