Omar Al-Terkawi Hasib, Yvon Savaria, Claude Thibeault. Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage. IEEE Trans. VLSI Syst., 28(3):764-776, 2020. [doi]
@article{HasibST20,
title = {Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage},
author = {Omar Al-Terkawi Hasib and Yvon Savaria and Claude Thibeault},
year = {2020},
doi = {10.1109/TVLSI.2019.2949037},
url = {https://doi.org/10.1109/TVLSI.2019.2949037},
researchr = {https://researchr.org/publication/HasibST20},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {28},
number = {3},
pages = {764-776},
}