Toshiaka Hatano, K. Zhang, Said Ghani Khan, T. Nguyen, Guido Herrmann, Christopher Edwards, Stuart C. Burgess, Mervyn Miles. A specimen-tracking controller for the transverse dynamic force microscope in non-contact mode. In 2016 American Control Conference, ACC 2016, Boston, MA, USA, July 6-8, 2016. pages 7384-7389, IEEE, 2016. [doi]
Abstract is missing.