Charles F. Hawkins, Ali Keshavarzi, Jaume Segura 0001. CMOS IC nanometer technology failure mechanisms. In Proceedings of the IEEE Custom Integrated Circuits Conference, CICC 2003, San Jose, CA, USA, September 21 - 24, 2003. pages 605-611, IEEE, 2003. [doi]
@inproceedings{HawkinsKS03-0,
title = {CMOS IC nanometer technology failure mechanisms},
author = {Charles F. Hawkins and Ali Keshavarzi and Jaume Segura 0001},
year = {2003},
doi = {10.1109/CICC.2003.1249470},
url = {https://doi.org/10.1109/CICC.2003.1249470},
researchr = {https://researchr.org/publication/HawkinsKS03-0},
cites = {0},
citedby = {0},
pages = {605-611},
booktitle = {Proceedings of the IEEE Custom Integrated Circuits Conference, CICC 2003, San Jose, CA, USA, September 21 - 24, 2003},
publisher = {IEEE},
isbn = {0-7803-7842-3},
}