Terumine Hayashi, Naotsugu Ikeda, Tsuyoshi Shinogi, Haruhiko Takase, Hidehiko Kita. Low Power Oriented Test Modification and Compression Techniques for Scan Based Core Testing. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 327-332, IEEE, 2006. [doi]
Abstract is missing.