Chinmayee Hazarika, Sujan Neroula, Santanu Sharma. Long Term Drift Observed in ISFET Due to the Penetration of H+ Ions into the Oxide Layer. In Bhabesh Deka, Pradipta Maji, Sushmita Mitra, Dhruba Kumar Bhattacharyya, Prabin Kumar Bora, Sankar Kumar Pal, editors, Pattern Recognition and Machine Intelligence - 8th International Conference, PReMI 2019, Tezpur, India, December 17-20, 2019, Proceedings, Part II. Volume 11942 of Lecture Notes in Computer Science, pages 543-553, Springer, 2019. [doi]
Abstract is missing.