Cosmic-ray soft error rate characterization of a standard 0.6-/spl mu/m CMOS process

Peter Hazucha, Christer Svensson, Stephen A. Wender. Cosmic-ray soft error rate characterization of a standard 0.6-/spl mu/m CMOS process. J. Solid-State Circuits, 35(10):1422-1429, 2000. [doi]

Abstract

Abstract is missing.