A Bayesian Local Binary Pattern texture descriptor

Chu He, Timo Ahonen, Matti Pietikäinen. A Bayesian Local Binary Pattern texture descriptor. In 19th International Conference on Pattern Recognition (ICPR 2008), December 8-11, 2008, Tampa, Florida, USA. pages 1-4, IEEE, 2008. [doi]

Authors

Chu He

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Timo Ahonen

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Matti Pietikäinen

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