Chu He, Timo Ahonen, Matti Pietikäinen. A Bayesian Local Binary Pattern texture descriptor. In 19th International Conference on Pattern Recognition (ICPR 2008), December 8-11, 2008, Tampa, Florida, USA. pages 1-4, IEEE, 2008. [doi]
@inproceedings{HeAP08,
title = {A Bayesian Local Binary Pattern texture descriptor},
author = {Chu He and Timo Ahonen and Matti Pietikäinen},
year = {2008},
doi = {10.1109/ICPR.2008.4761100},
url = {http://dx.doi.org/10.1109/ICPR.2008.4761100},
researchr = {https://researchr.org/publication/HeAP08},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {19th International Conference on Pattern Recognition (ICPR 2008), December 8-11, 2008, Tampa, Florida, USA},
publisher = {IEEE},
isbn = {978-1-4244-2175-6},
}