Detailed analyses in prediction of capacitive-mismatch-induced offset in dynamic comparators

Jun He, Degang Chen, Randall L. Geiger. Detailed analyses in prediction of capacitive-mismatch-induced offset in dynamic comparators. In International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France. pages 2390-2393, IEEE, 2010. [doi]

Abstract

Abstract is missing.