Test-Point Insertion Efficiency Analysis for LBIST in High-Assurance Applications

Miao He, Gustavo K. Contreras, Dat Tran, LeRoy Winemberg, Mark Tehranipoor. Test-Point Insertion Efficiency Analysis for LBIST in High-Assurance Applications. IEEE Trans. VLSI Syst., 25(9):2602-2615, 2017. [doi]

Abstract

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