Chen He, Margarida F. Jacome, Gustavo de Veciana. Scalable defect mapping and configuration of memory-based nanofabrics. In Tenth IEEE International High-Level Design Validation and Test Workshop 2005, Napa Valley, CA, USA, November 30 - December 2, 2005. pages 11-18, IEEE Computer Society, 2005. [doi]
Abstract is missing.