Zhiyuan He, Zebo Peng, Petru Eles, Paul M. Rosinger, Bashir M. Al-Hashimi. Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 477-485, IEEE Computer Society, 2006. [doi]
Abstract is missing.