Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving

Zhiyuan He, Zebo Peng, Petru Eles, Paul M. Rosinger, Bashir M. Al-Hashimi. Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving. J. Electronic Testing, 24(1-3):247-257, 2008. [doi]

@article{HePERA08,
  title = {Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving},
  author = {Zhiyuan He and Zebo Peng and Petru Eles and Paul M. Rosinger and Bashir M. Al-Hashimi},
  year = {2008},
  doi = {10.1007/s10836-007-5030-6},
  url = {http://dx.doi.org/10.1007/s10836-007-5030-6},
  tags = {testing, context-aware, partitioning},
  researchr = {https://researchr.org/publication/HePERA08},
  cites = {0},
  citedby = {0},
  journal = {J. Electronic Testing},
  volume = {24},
  number = {1-3},
  pages = {247-257},
}