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Zhiyuan He, Zebo Peng, Petru Eles, Paul M. Rosinger, Bashir M. Al-Hashimi. Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving. J. Electronic Testing, 24(1-3):247-257, 2008. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Thermal-Aware SoC Test Scheduling with Test Set Partitioning and InterleavingZhiyuan He, Zebo Peng, Petru Eles, Paul M. Rosinger, Bashir M. Al-Hashimi. dft 2006: 477-485 [doi] Power constrained and defect-probability driven SoC test scheduling with test set partitioningZhiyuan He, Zebo Peng, Petru Eles. date 2006: 291-296 [doi]
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