Miao Tony He, Jungmin Park, Adib Nahiyan, Apostol Vassilev, Yier Jin, Mark Tehranipoor. RTL-PSC: Automated Power Side-Channel Leakage Assessment at Register-Transfer Level. In 37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019. pages 1-6, IEEE, 2019. [doi]
@inproceedings{HePNVJT19,
title = {RTL-PSC: Automated Power Side-Channel Leakage Assessment at Register-Transfer Level},
author = {Miao Tony He and Jungmin Park and Adib Nahiyan and Apostol Vassilev and Yier Jin and Mark Tehranipoor},
year = {2019},
doi = {10.1109/VTS.2019.8758600},
url = {https://doi.org/10.1109/VTS.2019.8758600},
researchr = {https://researchr.org/publication/HePNVJT19},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019},
publisher = {IEEE},
isbn = {978-1-7281-1170-4},
}