Miao Tony He, Jungmin Park, Adib Nahiyan, Apostol Vassilev, Yier Jin, Mark Tehranipoor. RTL-PSC: Automated Power Side-Channel Leakage Assessment at Register-Transfer Level. In 37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.