Efficient Functional In-Field Self-Test for Deep Learning Accelerators

Yi He, Takumi Uezono, Yanjing Li. Efficient Functional In-Field Self-Test for Deep Learning Accelerators. In IEEE International Test Conference, ITC 2021, Anaheim, CA, USA, October 10-15, 2021. pages 93-102, IEEE, 2021. [doi]

Abstract

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