Synchro-Tokens: Eliminating Nondeterminism to Enable Chip-Level Test of Globally-Asynchronous Locally-Synchronous SoC?s - researchr publication authors

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Matthew W. Heath, Wayne P. Burleson, Ian G. Harris. Synchro-Tokens: Eliminating Nondeterminism to Enable Chip-Level Test of Globally-Asynchronous Locally-Synchronous SoC?s. In 2004 Design, Automation and Test in Europe Conference and Exposition (DATE 2004), 16-20 February 2004, Paris, France. pages 410-415, IEEE Computer Society, 2004. [doi]

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