Matthew W. Heath, Wayne P. Burleson, Ian G. Harris. Synchro-Tokens: Eliminating Nondeterminism to Enable Chip-Level Test of Globally-Asynchronous Locally-Synchronous SoC?s. In 2004 Design, Automation and Test in Europe Conference and Exposition (DATE 2004), 16-20 February 2004, Paris, France. pages 410-415, IEEE Computer Society, 2004. [doi]
@inproceedings{HeathBH04,
title = {Synchro-Tokens: Eliminating Nondeterminism to Enable Chip-Level Test of Globally-Asynchronous Locally-Synchronous SoC?s},
author = {Matthew W. Heath and Wayne P. Burleson and Ian G. Harris},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/date/2004/2085/01/208510410abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/HeathBH04},
cites = {0},
citedby = {0},
pages = {410-415},
booktitle = {2004 Design, Automation and Test in Europe Conference and Exposition (DATE 2004), 16-20 February 2004, Paris, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-2085-5},
}