Marcel Heertjes, Tim Tso. Robustness, Convergence, and Lyapunov Stability of a Nonlinear Iterative Learning Control Applied at a Wafer Scanner. In American Control Conference, ACC 2007, New York, NY, USA, 9-13 July, 2007. pages 5490-5495, IEEE, 2007. [doi]
@inproceedings{HeertjesT07,
title = {Robustness, Convergence, and Lyapunov Stability of a Nonlinear Iterative Learning Control Applied at a Wafer Scanner},
author = {Marcel Heertjes and Tim Tso},
year = {2007},
doi = {10.1109/ACC.2007.4282414},
url = {https://doi.org/10.1109/ACC.2007.4282414},
researchr = {https://researchr.org/publication/HeertjesT07},
cites = {0},
citedby = {0},
pages = {5490-5495},
booktitle = {American Control Conference, ACC 2007, New York, NY, USA, 9-13 July, 2007},
publisher = {IEEE},
}