Michael Hefenbrock, Dennis D. Weller, Michael Beigl, Mehdi Baradaran Tahoori. Fast and Accurate High-Sigma Failure Rate Estimation through Extended Bayesian Optimized Importance Sampling. In 2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020. pages 103-108, IEEE, 2020. [doi]
@inproceedings{HefenbrockWBT20,
title = {Fast and Accurate High-Sigma Failure Rate Estimation through Extended Bayesian Optimized Importance Sampling},
author = {Michael Hefenbrock and Dennis D. Weller and Michael Beigl and Mehdi Baradaran Tahoori},
year = {2020},
doi = {10.23919/DATE48585.2020.9116242},
url = {https://doi.org/10.23919/DATE48585.2020.9116242},
researchr = {https://researchr.org/publication/HefenbrockWBT20},
cites = {0},
citedby = {0},
pages = {103-108},
booktitle = {2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020},
publisher = {IEEE},
isbn = {978-3-9819263-4-7},
}