Michael Hefenbrock, Dennis D. Weller, Michael Beigl, Mehdi Baradaran Tahoori. Fast and Accurate High-Sigma Failure Rate Estimation through Extended Bayesian Optimized Importance Sampling. In 2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020. pages 103-108, IEEE, 2020. [doi]
Abstract is missing.