Markus Helfenstein, Ertan Baykal, Kurt Müller, Alexander Lampe. Error vector magnitude (EVM) measurements for GSM/EDGE applications revised under production conditions. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 5003-5006, IEEE, 2005. [doi]
Abstract is missing.