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Efficient Online and Offline Testing of Embedded DRAMs

Sybille Hellebrand, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, Vyacheslav N. Yarmolik. Efficient Online and Offline Testing of Embedded DRAMs. IEEE Transactions on Computers, 51(7):801-809, 2002. [doi]

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Sybille Hellebrand

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Hans-Joachim Wunderlich

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Alexander A. Ivaniuk

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Yuri V. Klimets

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Vyacheslav N. Yarmolik

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