Sybille Hellebrand, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, Vyacheslav N. Yarmolik. Efficient Online and Offline Testing of Embedded DRAMs. IEEE Transactions on Computers, 51(7):801-809, 2002. [doi]
@article{HellebrandWIKY02,
title = {Efficient Online and Offline Testing of Embedded DRAMs},
author = {Sybille Hellebrand and Hans-Joachim Wunderlich and Alexander A. Ivaniuk and Yuri V. Klimets and Vyacheslav N. Yarmolik},
year = {2002},
url = {http://www.computer.org:80/tc/tc2002/t0801abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/HellebrandWIKY02},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Computers},
volume = {51},
number = {7},
pages = {801-809},
}