Sybille Hellebrand, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, Vyacheslav N. Yarmolik. Efficient Online and Offline Testing of Embedded DRAMs. IEEE Transactions on Computers, 51(7):801-809, 2002. [doi]
No references recorded for this publication.
No citations of this publication recorded.