Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul. Reliability analysis for integrated circuit amplifiers used in neural measurement systems. In Enrico Macii, editor, Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013. pages 713-716, EDA Consortium San Jose, CA, USA / ACM DL, 2013. [doi]
Abstract is missing.