An Approach to Chip-Internal Current Monitoring and Measurement Using an Electron Beam Tester - researchr publication authors

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Klaus Helmreich, Peter Nagel, Werner Wolz, Klaus D. Müller-Glaser. An Approach to Chip-Internal Current Monitoring and Measurement Using an Electron Beam Tester. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 256-262, IEEE Computer Society, 1991.

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