Klaus Helmreich, Peter Nagel, Werner Wolz, Klaus D. Müller-Glaser. An Approach to Chip-Internal Current Monitoring and Measurement Using an Electron Beam Tester. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 256-262, IEEE Computer Society, 1991.
Abstract is missing.