Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-Wise Test Configurations for Software Product Lines

Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Patrick Heymans, Yves Le Traon. Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-Wise Test Configurations for Software Product Lines. IEEE Trans. Software Eng., 40(7):650-670, 2014. [doi]

Authors

Christopher Henard

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Mike Papadakis

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Gilles Perrouin

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Jacques Klein

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Patrick Heymans

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Yves Le Traon

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