Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Patrick Heymans, Yves Le Traon. Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-Wise Test Configurations for Software Product Lines. IEEE Trans. Software Eng., 40(7):650-670, 2014. [doi]
@article{HenardPPKHT14,
title = {Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-Wise Test Configurations for Software Product Lines},
author = {Christopher Henard and Mike Papadakis and Gilles Perrouin and Jacques Klein and Patrick Heymans and Yves Le Traon},
year = {2014},
doi = {10.1109/TSE.2014.2327020},
url = {http://doi.ieeecomputersociety.org/10.1109/TSE.2014.2327020},
researchr = {https://researchr.org/publication/HenardPPKHT14},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Software Eng.},
volume = {40},
number = {7},
pages = {650-670},
}