Using Line Segments as Structuring Elements for Sampling-Invariant Measurements

Cris L. Luengo Hendriks, Lucas J. van Vliet. Using Line Segments as Structuring Elements for Sampling-Invariant Measurements. IEEE Trans. Pattern Anal. Mach. Intell., 27(11):1826-1831, 2005. [doi]

Authors

Cris L. Luengo Hendriks

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Lucas J. van Vliet

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