Cris L. Luengo Hendriks, Lucas J. van Vliet. Using Line Segments as Structuring Elements for Sampling-Invariant Measurements. IEEE Trans. Pattern Anal. Mach. Intell., 27(11):1826-1831, 2005. [doi]
@article{HendriksV05,
title = {Using Line Segments as Structuring Elements for Sampling-Invariant Measurements},
author = {Cris L. Luengo Hendriks and Lucas J. van Vliet},
year = {2005},
doi = {10.1109/TPAMI.2005.228},
url = {http://doi.ieeecomputersociety.org/10.1109/TPAMI.2005.228},
researchr = {https://researchr.org/publication/HendriksV05},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Pattern Anal. Mach. Intell.},
volume = {27},
number = {11},
pages = {1826-1831},
}