Jörg Henkel. The triangle of power density, circuit degradation and reliability. In Massimo Alioto, Hai Helen Li, Jürgen Becker, Ulf Schlichtmann, Ramalingam Sridhar, editors, 30th IEEE International System-on-Chip Conference, SOCC 2017, Munich, Germany, September 5-8, 2017. pages 1-2, IEEE, 2017. [doi]
@inproceedings{Henkel17-2,
title = {The triangle of power density, circuit degradation and reliability},
author = {Jörg Henkel},
year = {2017},
doi = {10.1109/SOCC.2017.8226039},
url = {https://doi.org/10.1109/SOCC.2017.8226039},
researchr = {https://researchr.org/publication/Henkel17-2},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {30th IEEE International System-on-Chip Conference, SOCC 2017, Munich, Germany, September 5-8, 2017},
editor = {Massimo Alioto and Hai Helen Li and Jürgen Becker and Ulf Schlichtmann and Ramalingam Sridhar},
publisher = {IEEE},
isbn = {978-1-5386-4034-0},
}