Timothy R. Henry, Thomas Soo. Burn-in Elimination of a High Volume Microprocessor Using I::DDQ::. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 242-249, IEEE Computer Society, 1996.
@inproceedings{HenryS96,
title = {Burn-in Elimination of a High Volume Microprocessor Using I::DDQ::},
author = {Timothy R. Henry and Thomas Soo},
year = {1996},
researchr = {https://researchr.org/publication/HenryS96},
cites = {0},
citedby = {0},
pages = {242-249},
booktitle = {Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996},
publisher = {IEEE Computer Society},
isbn = {0-7803-3541-4},
}