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Burn-in Elimination of a High Volume Microprocessor Using I::DDQ::

Timothy R. Henry, Thomas Soo. Burn-in Elimination of a High Volume Microprocessor Using I::DDQ::. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 242-249, IEEE Computer Society, 1996.

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