Richard F. Herlein. Optimizing the Timing Architecture of a Digital LSI Test System. In Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983. pages 200-211, IEEE Computer Society, 1983.
@inproceedings{Herlein83,
title = {Optimizing the Timing Architecture of a Digital LSI Test System},
author = {Richard F. Herlein},
year = {1983},
tags = {optimization, architecture, testing},
researchr = {https://researchr.org/publication/Herlein83},
cites = {0},
citedby = {0},
pages = {200-211},
booktitle = {Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983},
publisher = {IEEE Computer Society},
}