Testing Skew and Logic Faults in SoC Interconnects

Nestor Hernandez, VĂ­ctor H. Champac. Testing Skew and Logic Faults in SoC Interconnects. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2008, 7-9 April 2008, Montpellier, France. pages 151-156, IEEE Computer Society, 2008. [doi]

Abstract

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