Jailene Hernandez, Johan Castrillon, Manuel Jimenez, Angel de la Torre, Pedro Escalona, Rogelio Palomera. A virtual instrument design for low-cost charge-pumping characterization of integrated MOSFETs. In 16th Latin-American Test Symposium, LATS 2015, Puerto Vallarta, Mexico, March 25-27, 2015. pages 1-4, IEEE, 2015. [doi]
Abstract is missing.