Robbert van Herpen, Tom Oomen, Marc M. J. van de Wal, Okko H. Bosgra. Experimental evaluation of robust-control-relevance: A confrontation with a next-generation wafer stage. In American Control Conference, ACC 2010, Baltimore, Maryland, USA, June 30 - July 2, 2010. pages 3493-3499, IEEE, 2010. [doi]
@inproceedings{HerpenOWB10,
title = {Experimental evaluation of robust-control-relevance: A confrontation with a next-generation wafer stage},
author = {Robbert van Herpen and Tom Oomen and Marc M. J. van de Wal and Okko H. Bosgra},
year = {2010},
doi = {10.1109/ACC.2010.5530866},
url = {https://doi.org/10.1109/ACC.2010.5530866},
researchr = {https://researchr.org/publication/HerpenOWB10},
cites = {0},
citedby = {0},
pages = {3493-3499},
booktitle = {American Control Conference, ACC 2010, Baltimore, Maryland, USA, June 30 - July 2, 2010},
publisher = {IEEE},
isbn = {978-1-4244-7427-1},
}