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Yoshinobu Higami, Hiroshi Furutani, Takao Sakai, Shuichi Kameyama, Hiroshi Takahashi. Test Pattern Selection for Defect-Aware Test. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 102-107, IEEE Computer Society, 2011. [doi]

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