Yoshinobu Higami, Hiroshi Furutani, Takao Sakai, Shuichi Kameyama, Hiroshi Takahashi. Test Pattern Selection for Defect-Aware Test. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 102-107, IEEE Computer Society, 2011. [doi]
@inproceedings{HigamiFSKT11,
title = {Test Pattern Selection for Defect-Aware Test},
author = {Yoshinobu Higami and Hiroshi Furutani and Takao Sakai and Shuichi Kameyama and Hiroshi Takahashi},
year = {2011},
doi = {10.1109/ATS.2011.24},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2011.24},
researchr = {https://researchr.org/publication/HigamiFSKT11},
cites = {0},
citedby = {0},
pages = {102-107},
booktitle = {Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011},
publisher = {IEEE Computer Society},
isbn = {978-1-4577-1984-4},
}