Yoshinobu Higami, Seiji Kajihara, Shin-ya Kobayashi, Yuzo Takamatsu. Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications to Test Length/Power Reduction. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 46-49, IEEE Computer Society, 2004. [doi]
Abstract is missing.