Yoshinobu Higami, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo. Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool. IEICE Transactions, 95-D(4):1093-1100, 2012. [doi]
@article{HigamiOYTSA12,
title = {Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool},
author = {Yoshinobu Higami and Satoshi Ohno and Hironori Yamaoka and Hiroshi Takahashi and Yoshihiro Shimizu and Takashi Aikyo},
year = {2012},
url = {http://search.ieice.org/bin/summary.php?id=e95-d_4_1093},
researchr = {https://researchr.org/publication/HigamiOYTSA12},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {95-D},
number = {4},
pages = {1093-1100},
}