Yoshinobu Higami, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo. Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool. IEICE Transactions, 95-D(4):1093-1100, 2012. [doi]
Abstract is missing.